The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Jul. 21, 2016
Applicant:

Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;

Inventors:

Kazushi Uno, Atsugi, JP;

Fumio Takei, Isehara, JP;

Takeo Kasajima, Machida, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01); G01K 11/32 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35358 (2013.01); G01D 5/35361 (2013.01); G01D 5/35364 (2013.01); G01K 11/32 (2013.01); G01K 2011/324 (2013.01);
Abstract

An abnormality detection system includes an optical fiber, a backscattered light detector, and a data processor. The backscattered light detector is connected to one end side and the other end side of the optical fiber, and configured to acquire a first intensity distribution of backscattered light by making light incident on the optical fiber from the one end side and to acquire a second intensity distribution of backscattered light by making light incident on the optical fiber from the other end side. The data processor calculates transmission loss at each position in the longitudinal direction of the optical fiber by using the first and second intensity distributions and a normalization function, and determines whether or not there is an abnormality based on the result of the calculation.


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