The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Apr. 13, 2012
Arun Hampapur, Norwalk, CT (US);
Zhong BO Jiang, Beijing, CN;
Hongfei LI, Yorktown Heights, NY (US);
Shilpa N. Mahatma, Mohegan Lake, NY (US);
Arun Hampapur, Norwalk, CT (US);
Zhong Bo Jiang, Beijing, CN;
Hongfei Li, Yorktown Heights, NY (US);
Shilpa N. Mahatma, Mohegan Lake, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, system and computer program product for detecting anomalies in a metering system. In one embodiment, data representing usage of a defined commodity are collected from meters, and the data collected over a given time period are analyzed to identify any of the meters showing at least one defined type of anomalous usage pattern. For each of the meters showing an anomalous usage patterns, an anomaly score is determined for the usage pattern shown, and the anomaly scores are used to rank the meters. In one embodiment, the collected data are analyzed to identify any of the meters showing one or more of a group of types of anomalous patterns including meter-no-reading, meter-by-pass, and meter-silting patterns. Embodiments of the invention utilize time series techniques and data analysis on meter reading data. Further, embodiments of the invention require no additional installation of equipment or sensors.