The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Mar. 23, 2016
Applicant:
Northrop Grumman Litef Gmbh, Freiburg, DE;
Inventors:
Uwe Herberth, Hugstetten, DE;
Tim Martin, Freiburg, DE;
Assignee:
Northrop Grumman LITEF GmbH, , DE;
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/16 (2006.01); G01D 1/14 (2006.01); G01S 19/49 (2010.01); G01C 21/20 (2006.01); G01C 21/36 (2006.01);
U.S. Cl.
CPC ...
G01C 21/165 (2013.01); G01C 21/20 (2013.01); G01D 1/14 (2013.01); G01S 19/49 (2013.01); G01C 21/3605 (2013.01);
Abstract
Method for determining states of a system by means of an estimation filter, in which first state values are determined by calculating a mean value of a probability distribution for the states, in which a probability for deviation for the case that the first state values deviate from the actual states of the system is calculated, and in which the states of the system are measured as state data. In the method the first state values are corrected by means of the state data then, if the probability for deviation is larger than a threshold.