The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Aug. 27, 2014
Applicant:

Honeywell Asca Inc., Mississauga, CA;

Inventors:

Ronald E. Beselt, Burnaby, CA;

Cristian Andronic, Burnaby, CA;

Gertjan Hofman, Vancouver, CA;

Sudhir Thalore, Burnaby, CA;

Assignee:

Honeywell Limited, Ontario, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/89 (2006.01); G01B 7/31 (2006.01); G01B 21/24 (2006.01);
U.S. Cl.
CPC ...
G01B 21/24 (2013.01); G01B 7/31 (2013.01); G01N 21/8901 (2013.01); G01N 21/8903 (2013.01); G01B 2210/44 (2013.01);
Abstract

A scanning measurement system includes independently driven, self-aligning, dual-sided heads. The system is configured to perform a method that includes receiving information associated with a discrepancy in a desired cross direction alignment of a first sensor head and a second sensor head that are disposed on opposite sides of a web of material and that are configured to move in a cross direction relative to the web. The method also includes adjusting a velocity of at least one of the sensor heads based on the received information to improve the cross direction alignment of the first sensor head and the second sensor head.


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