The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Jun. 13, 2017
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Koji Takahashi, Osaka, JP;

Takashi Naruse, Osaka, JP;

Hayato Oba, Osaka, JP;

Assignee:

Keyence Corporation, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01B 11/25 (2006.01); G06T 7/13 (2017.01); G06T 7/70 (2017.01); G01B 5/02 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G01B 21/04 (2006.01); G05B 19/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 5/02 (2013.01); G01B 11/25 (2013.01); G01B 21/04 (2013.01); G05B 19/00 (2013.01); G06K 9/4604 (2013.01); G06K 9/6202 (2013.01); G06T 7/0004 (2013.01); G06T 7/13 (2017.01); G06T 7/70 (2017.01); G06T 2200/24 (2013.01); G06T 2207/30164 (2013.01);
Abstract

There are included a probe that can be arranged in an imaging field of view, a horizontal drive section for causing the probe to contact a side surface of a workpiece on a stage, a display section for displaying a model image, a contact position designation section for receiving designation of contact target position information in the model image, a characteristic amount information setting section for setting characteristic amount information, a measurement setting information storage section for storing a plurality of pieces of contact target position information and the characteristic amount information, and a measurement control section for identifying a position and an attitude of the workpiece from a workpiece image by using the characteristic amount information, for identifying a plurality of contact target positions on the side surface of the workpiece where the probe should contact, based on the identified position and the identified attitude of the workpiece.


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