The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Sep. 01, 2014
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota-shi, Aichi, JP;

Inventor:

Katsunori Danno, Susono, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 19/12 (2006.01); C30B 29/36 (2006.01); C30B 19/04 (2006.01);
U.S. Cl.
CPC ...
C30B 19/12 (2013.01); C30B 19/04 (2013.01); C30B 29/36 (2013.01);
Abstract

A SiC single crystal having low density of threading screw dislocations, threading edge dislocations, micropipe defects, base plane dislocations and stacking faults is provided. This is achieved by a method for producing a SiC single crystal in which a SiC seed crystal substrate is contacted with a Si—C solution having a temperature gradient such that the temperature decreases from the interior toward the surface, to grow a SiC single crystal, the method including: a first step in which a SiC single crystal is grown with a (1-100) plane as the growth surface, a second step in which a {0001} plane is exposed from the grown SiC single crystal, and a third step in which the SiC single crystal having the exposed {0001} plane is used as a seed crystal, and the {0001} plane is used as the growth surface for growth of a SiC single crystal.


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