The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Dec. 05, 2016
Applicant:

Institute for Information Industry, Taipei, TW;

Inventors:

Yin-Jing Tien, Taipei, TW;

Yi-Chang Chen, Taipei, TW;

Cheng-Juei Yu, New Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/00 (2006.01); B29C 47/92 (2006.01); G05B 19/19 (2006.01);
U.S. Cl.
CPC ...
B29C 47/92 (2013.01); G05B 19/19 (2013.01); B29C 2947/9259 (2013.01); B29C 2947/92295 (2013.01); G05B 2219/37446 (2013.01);
Abstract

A plastic extrusion process control method includes: receiving a plurality of historical process data of a plastic extrusion process from a database, in which each of the historical process data includes a plurality of critical parameters and a plurality of quality value; dividing each of the critical parameters into a plurality of levels; grouping the historical process data according to the levels of the critical parameters to obtain a plurality of parameter sets; calculating a quality indicator of each of the parameter sets to build an empirical response surface according to the historical process data corresponding to the parameter sets; and configuring the critical parameters of the plastic extrusion process to an automatic manufacturing system according to the empirical response surface, such that the automatic manufacturing system performs the plastic extrusion process according to the critical parameters.


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