The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Nov. 16, 2016
Applicant:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Inventors:

Christoph Boehm, Viernheim, DE;

Sascha Lutz, Nuestadt, DE;

Juergen Spinke, Lorsch, DE;

Thorsten Brueckner, Schriesheim, DE;

Assignee:

Roche Diagnostics Operations, Inc., Indianapolis, IN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 35/00 (2006.01); G01N 21/07 (2006.01); G01N 21/64 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
B01L 3/50273 (2013.01); B01L 3/502715 (2013.01); G01N 21/07 (2013.01); G01N 21/6428 (2013.01); G01N 35/00069 (2013.01); G01N 35/00584 (2013.01); G01N 35/00871 (2013.01); B01L 2200/027 (2013.01); B01L 2200/10 (2013.01); B01L 2300/023 (2013.01); B01L 2300/045 (2013.01); B01L 2300/0627 (2013.01); B01L 2300/0645 (2013.01); B01L 2300/0803 (2013.01); B01L 2300/087 (2013.01); B01L 2400/0406 (2013.01); B01L 2400/0409 (2013.01); B01L 2400/0688 (2013.01); G01N 2021/0325 (2013.01); G01N 2035/00257 (2013.01); G01N 2035/00881 (2013.01);
Abstract

An automatic analyzer cartridge, spinnable around a rotational axis, has a support structure with a front face perpendicular to the rotational axis, a fluidic structure for processing a biological sample into the processed biological sample, a measurement structure with at least one detection zone on the front face, and a rotatable lid covering the front face. The rotatable lid is rotatable about the rotational axis relative to the support structure from a first position relative to the support structure to a second position relative to the support structure. The rotatable lid has a sample inlet opening and a detection zone opening. In the first position, a sample inlet is aligned with the sample inlet opening and the measurement structure is covered by the rotatable lid. In the second position, the sample inlet is covered by the rotatable lid and the measurement structure is aligned with the detection zone opening.


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