The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Sep. 07, 2011
Applicant:
Kenji Taira, Tokyo, JP;
Inventor:
Kenji Taira, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 5/00 (2006.01); A61B 1/00 (2006.01); A61B 1/06 (2006.01); A61B 90/20 (2016.01);
U.S. Cl.
CPC ...
A61B 5/0062 (2013.01); A61B 1/00172 (2013.01); A61B 1/06 (2013.01); A61B 5/0066 (2013.01); A61B 90/20 (2016.02); A61B 5/7257 (2013.01); A61B 2576/00 (2013.01);
Abstract
Provided is an optical imaging system which visualizes a deep portion of a scattering body. The optical imaging system generates an image of an object to be inspected by removing a signal resulting from light reflected and scattered once by a surface of the object to be inspected from the signal obtained by means of an optical system analogous to Optical Coherence Tomography, thereby extracting a signal resulting from multiply scattered light.