The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Dec. 14, 2015
Amo Wavefront Sciences, Llc, Albuquerque, NM (US);
Paul Pulaski, Albuquerque, NM (US);
Daniel R. Neal, Tijeras, CA (US);
Thomas D. Raymond, Edgewood, CA (US);
Stephen W. Farrer, Albuquerque, NM (US);
Daniel R. Hamrick, Cedar Crest, NM (US);
Richard J. Copland, Albuquerque, NM (US);
AMO WaveFront Sciences, LLC, Santa Ana, CA (US);
Abstract
An optical coherence tomography (OCT) system includes: a light source; a multi-focal delay line; and a light detector. The multi-focal delay line includes: a positive lens; and an optical switch configured to: receive a light from the light source; selectively direct the sample light to the positive lens via a selected one of a plurality of light interfaces each located a different distance from the focal plane of the positive lens; and direct the sample light to an object to be measured. The light detector is configured to receive return light returned from the object to be measured in response to the sample light, and to receive a reference light produced from the light from the light source, and in response thereto to detect at least one interference signal. An associated OCT method may be performed with the OCT system.