The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Apr. 08, 2015
Fujifilm Corporation, Tokyo, JP;
Mai Hikita, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An endoscope apparatus includes an observation optical system, a solid-state imaging element, a memory section, and an image processing section, wherein the memory section stores the information therein for specifying the image cutting-out region for the process of cutting out the image for display, which corresponds to an overlapping region in which a displayable pixel area of the solid-state imaging element and an imaging area of the optical image to be formed on the solid-state imaging element by the observation optical system overlap one another, and overlap one another when the center of the imaging area is matched with the center of the display area, as the image cutting-out information, and the image processing section expands the image for display to an image size of the display area, when an image size of the cut-out image for display becomes smaller than the image size of the display area.