The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 02, 2018

Filed:

Mar. 17, 2016
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Masatoshi Yajima, Osaka, JP;

Akifumi Hashimoto, Osaka, JP;

Kenji Kawano, Osaka, JP;

Masahiro Yamazaki, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01G 7/04 (2006.01); F21V 23/00 (2015.01); F21Y 115/30 (2016.01); F21Y 115/10 (2016.01);
U.S. Cl.
CPC ...
A01G 7/045 (2013.01); F21V 23/003 (2013.01); F21Y 2115/10 (2016.08); F21Y 2115/30 (2016.08); Y02P 60/146 (2015.11);
Abstract

A plant cultivation apparatus of the present disclosure includes a first light source unit configured to include a first laser diode radiating a first light beam, and a first scanning mechanism scanning the first light beam and forming a first radiation region, a second light source unit configured to include a second laser diode radiating a second light beam, and a second scanning mechanism scanning the second light beam and forming a second radiation region, and a signal processor configured to control the first light source unit and the second light source unit. A wavelength of the first light beam is the same as a wavelength of the second light beam. The signal processor forms a multiple radiation region by causing the first radiation region and the second radiation region to overlap each other.


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