The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2018
Filed:
Sep. 12, 2017
Appareo Systems, Llc, Fargo, ND (US);
Bradley K. Schleusner, Fargo, ND (US);
Marshall T. Bremer, Fargo, ND (US);
Nicholas L. Butts, West Fargo, ND (US);
Appareo Systems, LLC, Fargo, ND (US);
Abstract
A grain quality sensor comprising a photosite array, an illumination source, a filter, and an electronics module, wherein the illumination source directs light onto a crop sample, wherein the filter limits passage of light into different parts of the photosite array such that certain locations on the photosite array only receive certain wavelengths of light reflected or fluoresced by the crop sample, wherein an electronics module is electrically connected to the photosite array and capable of determining which parts of the photosite array received light and the wavelengths of the light received, wherein the electronics module can analyze the optical data received by the photosite array, and wherein the analysis of the optical data is used to determine the composition of the crop sample.