The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Oct. 21, 2014
Applicant:

Olympus Corporation, Tokyo, JP;

Inventors:

Mikio Nakamura, Tokyo, JP;

Nau Satake, Yokohama, JP;

Hiroyuki Motohara, Hachioji, JP;

Takanori Sekido, Machida, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/00 (2006.01); H01L 27/32 (2006.01); G02F 1/00 (2006.01); H04N 5/225 (2006.01); A61B 1/00 (2006.01); A61B 1/045 (2006.01); A61B 1/05 (2006.01); H04N 5/378 (2011.01); G03B 17/17 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2257 (2013.01); A61B 1/00009 (2013.01); A61B 1/0011 (2013.01); A61B 1/045 (2013.01); A61B 1/051 (2013.01); G03B 17/17 (2013.01); H04N 5/2253 (2013.01); H04N 5/378 (2013.01); H04N 2005/2255 (2013.01);
Abstract

An imaging module includes: an imaging unit including a light receiving unit having a plurality of pixels arranged in a specified shape including a lattice shape and configured to receive light and to perform photoelectric conversion on the received light, the imaging unit being configured to capture an image of a subject and to output the image as a light quantity signal; a signal processing unit configured to perform signal processing on the light quantity signal; and a flexible substrate which includes a bendable insulating film and on which the imaging unit and the signal processing unit are mounted. The flexible substrate is bent to arrange the signal processing unit and the flexible substrate in a space extending from an outer edge of an incident surface of the imaging unit in a direction perpendicular to the incident surface while maintaining a shape of the outer edge.


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