The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2018
Filed:
Mar. 10, 2014
Litepoint Corporation, Sunnyvale, CA (US);
Christian Volf Olgaard, Saratoga, CA (US);
Ruizu Wang, San Ramon, CA (US);
Guang Shi, San Jose, CA (US);
LITEPOINT CORPORATION, Sunnyvale, CA (US);
Abstract
System and method for controlling test flow of a radio frequency (RF) signal transceiver device under test (DUT) by inducing an interrupt via an internal signal interface or an external signal interface (with one example of the latter being a baseband signal interface for conveying audio signals). With exemplary embodiments, one or more DUT control signals are provided to or otherwise initiated within the DUT by inducing an interrupt, including inducement via use of the signal interface. With further exemplary embodiments, one or more test control signals are also provided to RF circuitry that responds by transmitting one or more RF receive signals for the DUT and receives from the DUT one or more RF transmit signals related to the one or more DUT control signals.