The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Mar. 10, 2017
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Venkatesh Srinivasan, Plano, TX (US);

Kun Shi, Austin, TX (US);

Victoria Wang, Santa Monica, CA (US);

Nikolaus Klemmer, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03M 3/00 (2006.01); H03M 1/00 (2006.01); H03K 5/159 (2006.01);
U.S. Cl.
CPC ...
H03M 3/38 (2013.01); H03K 5/159 (2013.01); H03M 1/001 (2013.01); H03M 3/464 (2013.01);
Abstract

System and methods for input path matching in pipelined continuous-time Analog-to Digital Converters (ADCs), including pipelined Continuous-Time Delta Sigma Modulator (CTDSM) based ADCs, includes an input delay circuit disposed in a continuous-time input path from an input of an analog input signal to a first summing circuit of the continuous-time ADC. At least one digital delay line is disposed between an output of an earlier stage sub-ADC (of a plurality of pipelined sub-ADCs) and a sub-digital-to-analog converter (DAC) that is coupled to the first summing circuit, and between the earlier stage sub-ADC and a digital noise cancellation filter. The digital delay line(s) is configured to enable calibration of delay of output of the earlier stage sub-ADC provided to the sub-DAC and the digital noise cancellation filter in accordance with process variations of the input delay match circuit to minimize residue output at first summing circuit.


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