The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Nov. 30, 2017
Applicants:

Daikin Industries, Ltd., Osaka, JP;

Toho Kasei Co., Ltd., Nara, JP;

Inventors:

Tetsuhiro Kodani, Osaka, JP;

Eri Mukai, Osaka, JP;

Takashi Kanemura, Osaka, JP;

Meiten Kou, Osaka, JP;

Susumu Kawato, Nara, JP;

Satoshi Shimizu, Nara, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); H01T 19/04 (2006.01); G01N 21/84 (2006.01); C08J 7/12 (2006.01); G01N 21/896 (2006.01);
U.S. Cl.
CPC ...
H01T 19/04 (2013.01); C08J 7/123 (2013.01); G01N 21/8422 (2013.01); G01N 21/896 (2013.01); C08J 2327/16 (2013.01); G01N 2021/8965 (2013.01);
Abstract

An object of the present invention is to provide a polarized vinylidene fluoride/tetrafluoroethylene copolymer resin film that can significantly reduce, when used as an optical film, the deterioration of the quality of video or still images formed by display elements. The present invention provides a polarized vinylidene fluoride/tetrafluoroethylene copolymer resin film having 2,000 or fewer spot defects per m, the number of spot defects being measured by a defect measurement method;


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