The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2018
Filed:
Mar. 18, 2016
Megachips Corporation, Osaka, JP;
Hiroyuki Nakamura, Chiba, JP;
MegaChips Corporation, Osaka, JP;
Abstract
A testing circuit is arranged in a semiconductor integrated circuit so as to detect a delay fault in the semiconductor integrated circuit. The semiconductor integrated circuit includes a first output control circuit having a plurality of sequential circuits, a first combination circuit connected to the first output control circuit, and a memory circuit connected to the first combination circuit. The testing circuit includes the first output control circuit; a second output control circuit; and a third output control circuit. The testing circuit, under control of a testing apparatus connected to the semiconductor integrated circuit, is configured to perform steps to detect the delay fault in the semiconductor integrated circuit.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile