The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2018
Filed:
Jun. 16, 2017
Industrial Technology Research Institute, Hsinchu, TW;
Yue-Min Jiang, New Taipei, TW;
Ho-Hsin Lee, Hsinchu, TW;
Yi-Fei Luo, Hsinchu County, TW;
I-Ju Yeh, Hsinchu, TW;
Li-Ying Wu, Hsinchu, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
A system for analyzing wound status is provided. The system includes an image obtaining device and an image analyzing device. The image obtaining device is configured to obtain a plurality of infrared (IR) images which are photographed from a wound of a user's body portion, wherein the plurality of IR images are photographed at different time. The image analyzing device is configured to align the plurality of IR images based on features of non-wound regions from the plurality of IR images, and then analyze wound image regions from the plurality of IR images for finding out variations of the wound.