The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2018
Filed:
Oct. 24, 2016
Fluke Corporation, Everett, WA (US);
Michael D. Stuart, Issaquah, WA (US);
John C. Bernet, Bremerton, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
Systems and methods can be used for analyzing image data to determine an amount of vibration and/or misalignment in an object under analysis. Image distortion present in the image data due to vibration and/or misalignment of the object during operation can be detected automatically or manually, and can be used to determine an amount of vibration and/or misalignment present. The determined amount of vibration and/or misalignment can be used to determine alignment calibration parameters for inputting into an alignment tool to facilitate alignment of the object. Various steps in determining the image distortion and/or the alignment calibration parameters can be performed using single components or can be spread across multiple components in a system.