The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10082922 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 25, 2018

Filed:

Jun. 02, 2017
Applicant:

Atmel Corporation, San Jose, CA (US);

Inventors:

Ingar Hanssen, Tiller, NO;

Rian Whelan, Drogheda, IE;

Assignee:

Atmel Corporation, Chandler, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/045 (2006.01); G06F 3/044 (2006.01); H03K 17/96 (2006.01); G01R 27/26 (2006.01); G06F 3/041 (2006.01); G06F 3/038 (2013.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); G01R 27/2605 (2013.01); G06F 3/0416 (2013.01); H03K 17/9622 (2013.01); G06F 3/038 (2013.01); G06F 3/045 (2013.01); H03K 2217/960725 (2013.01); H03K 2217/960745 (2013.01);
Abstract

In one embodiment, a device includes one or more processors and one or more memory units. The one or more memory units collectively store logic configured to cause the one or more processors to perform operations including obtaining a first measurement associated with a first voltage, the first voltage output by the mutual-capacitance measurement circuit in response to a first change in capacitance, and obtaining a second measurement associated with a second voltage, the second voltage output by the mutual-capacitance measurement circuit in response to a second change in capacitance. The operations further include calculating a differential measurement using a difference between the first measurement and the second measurement and determining whether a touch or proximity event has occurred based at least in part on the calculated differential measurement.


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