The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

May. 29, 2014
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Vijay Raman, Fort Collins, CO (US);

Amy Derbyshire, Boulder, CO (US);

Christopher Medrano, Longmont, CO (US);

Shiju Abraham Mathew, Scarborough, CA;

Ronald Frank Alton, Oceanside, CA (US);

Jon James Anderson, Boulder, CO (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/20 (2006.01); G05B 11/42 (2006.01); H01L 23/34 (2006.01); G06F 1/32 (2006.01);
U.S. Cl.
CPC ...
G06F 1/206 (2013.01); G05B 11/42 (2013.01); G06F 1/203 (2013.01); G06F 1/3203 (2013.01); G06F 1/324 (2013.01); G06F 1/3296 (2013.01); H01L 23/34 (2013.01); H01L 23/345 (2013.01); Y02D 10/126 (2018.01);
Abstract

A temperature of a component within the portable computing device (PCD) may be monitored along with a parameter associated with the temperature. The parameter associated with temperature may be an operating frequency, transmission power, or a data flow rate. It is determined if the temperature has exceeded a threshold value. If the temperature has exceeded the threshold value, then the temperature is compared with a temperature set point and a first error value is then calculated based on the comparison. Next, a first optimum value of the parameter is determined based on the first error value. If the temperature is below or equal to the threshold value, then a present value of the parameter is compared with a desired threshold for the parameter and a second error value is calculated based on the comparison. A second optimum value of the parameter may be determined based on the second error value.


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