The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Jun. 26, 2015
Applicants:

Changgeng Liu, Tampa, FL (US);

Myung K. Kim, Tampa, FL (US);

Inventors:

Changgeng Liu, Tampa, FL (US);

Myung K. Kim, Tampa, FL (US);

Assignee:

University of South Florida, Tampa, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 1/02 (2006.01); G02B 21/00 (2006.01); G03H 1/00 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0056 (2013.01); G02B 21/006 (2013.01); G02B 21/008 (2013.01); G03H 1/0005 (2013.01); G03H 1/041 (2013.01); G03H 1/0465 (2013.01); G03H 2001/005 (2013.01); G03H 2001/0469 (2013.01); G03H 2001/0473 (2013.01);
Abstract

A system for performing quantitative phase-contrast confocal microscopy includes a light source that emits light, a first beam splitter that splits the emitted light into an illumination path and a hologram path, means provided along the illumination path for delivering a first part of the emitted light to an object as a collimated line, a light sensor that captures light reflected off of the object to obtain an intensity image for the collimated line, and means provided along the hologram path for delivering a second part of the emitted light to the light sensor at an off-axis angle to obtain an off-axis hologram for the collimated line.


Find Patent Forward Citations

Liu, Changgeng. (2018). Systems and methods for performing quantitative phase-contrast confocal microscopy (U.S. Patent No. 10082653). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10082653

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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