The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2018
Filed:
Dec. 16, 2011
Jing Shen, Houston, TX (US);
Christopher Jones, Houston, TX (US);
Dingding Chen, Plano, TX (US);
Michael T. Pelletier, Houston, TX (US);
Robert Atkinson, Richmond, TX (US);
David Perkins, Irmo, SC (US);
Jing Shen, Houston, TX (US);
Christopher Jones, Houston, TX (US);
Dingding Chen, Plano, TX (US);
Michael T. Pelletier, Houston, TX (US);
Robert Atkinson, Richmond, TX (US);
David Perkins, Irmo, SC (US);
Halliburton Energy Services, Inc., Houston, TX (US);
Abstract
A method of calibration transfer for a testing instrument includes: collecting a first sample; generating a standard response of a first instrument based, at least in part, on the first sample; and performing instrument standardization of a second instrument based, at least in part, on the standard response of the first instrument. Data corresponding to a second sample is then obtained using the second instrument and a component of the second sample is identified based, at least in part, on a calibration model.