The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Oct. 29, 2016
Applicant:

Exnodes Inc., Palo Alto, CA (US);

Inventor:

Sri Rama Prasanna Pavani, Palo Alto, CA (US);

Assignee:

Exnodes Inc., Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/04 (2012.01); G06Q 10/06 (2012.01); G01N 21/95 (2006.01); G01R 31/26 (2014.01); G01N 33/00 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01R 31/26 (2013.01); G01N 21/9501 (2013.01); G01N 33/00 (2013.01); G06Q 10/06395 (2013.01); G06Q 50/04 (2013.01); G01N 2021/8416 (2013.01); G01N 2033/0095 (2013.01); Y02P 90/30 (2015.11);
Abstract

A system and method for improving production yield of an article with cloud based processing by storing process information in cloud; transferring functional results to cloud, with functional results having identifying information of articles that have failed a functional test and identifying information of articles that have passed functional test; generating a probable cause list from process information in cloud, wherein probable cause list is a shortlisted version of said process information in said cloud; and generating a root cause list from probable cause list in cloud, wherein root cause list comprises process information responsible for failure in failed articles, whereby root causes of failures are analytically determined with processing power, memory, and storage that are scalable, reliable, and upgradable on demand.


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