The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Dec. 20, 2013
Applicant:

Ncr Corporation, Duluth, GA (US);

Inventors:

Derek Kursikowski, Kitchener, CA;

Fredrik L. N. Kallin, Waterloo, CA;

Daniel Choi, Waterloo, CA;

Assignee:

NCR Corporation, Atlanta, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/04 (2006.01); G01N 33/34 (2006.01);
U.S. Cl.
CPC ...
G01N 27/048 (2013.01); G01N 33/34 (2013.01);
Abstract

The present invention provides a method and apparatus for determining at least one parameter associated with at least one media item, further comprising a first electrical contact element and a further electrical contact element supported in a spaced apart relationship via a contact support, wherein at least one electrical characteristic associated with a pathway between the first and further electrical contact elements is indicative of at least one parameter of at least one media item in contact with and extending between the first and further electrical contact elements.


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