The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Nov. 19, 2015
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

William M. Green, Irvington, NY (US);

Lionel Tombez, Neuchatel, CH;

Eric Zhang, Princeton, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 33/00 (2006.01); G01N 21/17 (2006.01); G01N 21/3504 (2014.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01N 21/27 (2013.01); G01N 21/274 (2013.01); G01N 33/0047 (2013.01); G01N 21/3504 (2013.01); G01N 21/39 (2013.01); G01N 2021/1748 (2013.01); G01N 2201/13 (2013.01);
Abstract

Provided herein are techniques for improved optical absorption measurements in the presence of time-varying etalons. In one aspect, a method for dynamic etalon fitting for adaptive background noise reduction in an optical sensor is provided. The method includes the steps of: obtaining a zero-gas spectrum measured using the optical sensor; obtaining an analyte gas spectrum of a target trace gas measured using the optical sensor; comparing the zero-gas spectrum and the analyte gas spectrum using fit parameters that compensate for drifting etalons in the optical sensor; and dynamically extracting the drifting etalons from the analyte gas spectrum to retrieve concentration of the target trace gas.


Find Patent Forward Citations

Loading…