The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Mar. 04, 2016
Applicant:

Harbin Institute of Technology, Harbin, Heilongjiang, CN;

Inventors:

Jiwen Cui, Heilongjiang, CN;

Shiyuan Zhao, Heilongjiang, CN;

Kunpeng Feng, Heilongjiang, CN;

Hong Dang, Heilongjiang, CN;

Junying Li, Heilongjiang, CN;

Jiubin Tan, Heilongjiang, CN;

Assignee:

HARBIN INSTITUTE OF TECHNOLOGY, Harbin, Heilongjiang, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01); G02B 6/02 (2006.01); G01B 11/16 (2006.01); G01B 5/012 (2006.01); H01S 3/067 (2006.01); H01S 3/16 (2006.01);
U.S. Cl.
CPC ...
G01B 11/007 (2013.01); G01B 5/012 (2013.01); G01B 11/18 (2013.01); G02B 6/02042 (2013.01); H01S 3/06791 (2013.01); H01S 3/1608 (2013.01);
Abstract

A method and equipment for dimensional measurement of a micro part based on fiber laser with multi-core fiber Bragg grating probe are provided, wherein a multi-core FBG probe with FBGs () inscribed in the core or cores out of the center of the multi-core fiber is used to transform the two-dimensional or three-dimensional contact displacement into the spectrum shifts with a high sensitivity. At the meantime, the FBGs in the multi-core FBG probe () work as the wavelength selection device of the fiber laser, the wavelength of the fiber laser will change thereby. So the contact displacement is finally converted into the wavelength change of the fiber laser. The method and equipment have the advantage of high sensitivity, low probing force, compact structure, high inspecting aspect ratio and immunity to environment interference.


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