The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2018

Filed:

Nov. 25, 2013
Applicant:

Primetals Technologies Austria Gmbh, Linz, AT;

Inventors:

Rainer Burger, Nuremberg, DE;

Ansgar Grüss, Erlangen, DE;

Helmut Hlobil, Niederneukirchen, AT;

Peter Hunt, Wimborne, GB;

Robert Linsbod, Linz, AT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/20 (2006.01); B21B 38/02 (2006.01); G01B 11/24 (2006.01); B21C 51/00 (2006.01); G01B 11/30 (2006.01); G01B 21/20 (2006.01); G01B 11/16 (2006.01); B21B 3/00 (2006.01);
U.S. Cl.
CPC ...
B21B 38/02 (2013.01); B21C 51/00 (2013.01); G01B 11/16 (2013.01); G01B 11/24 (2013.01); G01B 11/306 (2013.01); G01B 21/20 (2013.01); G01N 3/20 (2013.01); B21B 2003/001 (2013.01); B21B 2261/06 (2013.01);
Abstract

A method and apparatus for flatness measuring and measuring of residual stresses in a metallic flat product (): The method includes bending the flat product () in a bending device () such that a planar flat product () forms an arc () with a target bending radius rafter bending; measuring the contour and the actual bending radii r(y), in the region of the arc () of the bent flat product () at a plurality of positions along the width direction of the flat product (); and determining the flatness of the flat product () taking into account the measured contour of the bent flat product ().


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