The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2018
Filed:
May. 07, 2013
Sirona Dental Systems Gmbh, Bensheim, DE;
Frank Thiel, Ober-Ramstadt, DE;
Sascha Schneider, Muhltal, DE;
Sirona Dental Systems GMBH, Bensheim, DE;
Abstract
The invention relates to a method for measuring a dental situation comprising a plurality of implants and/or preparations for inserting dental restorations. Using a first measuring method, a first region of the dental situation is initially recorded while first measurement data are generated. The first region is selected to comprise at least two implants and/or preparations. Subsequently, object regions surrounding the implants and/or the preparations are established, and, while using a second measuring method, the established object regions are detected, and second measurement data are generated. The second measuring method is more precise than the first measuring method.