The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Apr. 04, 2014
Flir Systems, Inc., Wilsonville, OR (US);
Pierre Boulanger, Goleta, CA (US);
Per Elmfors, Goleta, CA (US);
Nicholas Högasten, Santa Barbara, CA (US);
Theodore R. Hoelter, Goleta, CA (US);
Katrin Strandemar, Rimbo, SE;
Barbara Sharp, Santa Barbara, CA (US);
Eric A. Kurth, Santa Barbara, CA (US);
FLIR Systems, Inc., Wilsonville, OR (US);
Abstract
Various techniques are provided for using one or more shielded (e.g., blinded, blocked, and/or obscured) infrared sensors of a thermal imaging device. In one example, a method includes capturing a signal from a shielded infrared sensor that is substantially blocked from receiving infrared radiation from a scene. The method also includes capturing a signal from an unshielded infrared sensor configured to receive the infrared radiation from the scene. The method also includes determining an average thermographic offset reference for the shielded and unshielded infrared sensors based on the captured signal of the shielded infrared sensor. The method also includes determining an absolute radiometric value for the scene based on the average thermographic offset reference and the captured signal of the unshielded infrared sensor.