The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Dec. 20, 2017
Applicant:

Cypress Semiconductor Corporation, San Jose, CA (US);

Inventors:

Yan Li, Morganville, NJ (US);

Kai Xie, San Jose, CA (US);

Hongwei Kong, Basking Ridge, NJ (US);

Jie Lai, Belle Mead, NJ (US);

Kamesh Medapalli, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 25/03 (2006.01); H04L 27/12 (2006.01); H04L 27/144 (2006.01);
U.S. Cl.
CPC ...
H04L 25/03834 (2013.01); H04L 25/03057 (2013.01); H04L 27/122 (2013.01); H04L 27/144 (2013.01);
Abstract

Calibrating a Gaussian frequency-shift keying modulation index includes generating a training sequence of bits, shaping a pulse from the training sequence according to an initial modulation index, and converting the shaped signal to a transmission signal. The transmission signal is then either looped through a radio frequency core or processed by frequency deviation estimation hardware to determine a frequency deviation. The frequency deviation is converted to a new modulation index, and potentially a ratio between a target modulation index and a measured modulation index as a scaling factor. The process is then iteratively repeated until a threshold frequency deviation is achieved.


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