The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Mar. 17, 2017
Applicant:

Qualcomm Incorporated, San Diego, CA (US);

Inventors:

Christian Gregory Sporck, Campbell, CA (US);

Georgios Paparrizos, Foster City, CA (US);

Hector Oporta, Gilroy, CA (US);

Shashank Prakash Mane, San Jose, CA (US);

Bang Sup Lee, Fremont, CA (US);

Thomas O'Brien, Powell, OH (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); H02J 7/00 (2006.01); G06F 13/38 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
H02J 7/0052 (2013.01); G01R 31/2834 (2013.01); G06F 11/221 (2013.01); G06F 13/385 (2013.01); H02J 2007/0062 (2013.01);
Abstract

Systems, methods, and apparatus for testing devices adapted for connection to other devices using universal serial bus (USB) are disclosed. Devices to be tested are caused to enter a special mode of operation when resistance measured at one or more terminals of a USB Type-C connector have values associated with the special mode of operation. One or more operations of the device are automatically initiated when the resistance coupled to the at least one terminal of the connector has a measured value that matches one of a set of resistance values maintained by the device. The one or more operations may include configuring a power management circuit based on the measured value, and entering a mode of operation that controls startup of at least one processor on the device when the measured value matches a first resistance value.


Find Patent Forward Citations

Loading…