The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Mar. 21, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Hiroshi Yoshikawa, Kawasaki, JP;
Shinji Uchiyama, Utsunomiya, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Even in a case where an amount-of-reflected-light distribution of a surface is locally different, in order to measure a distance with high accuracy, at least one embodiment of a distance measurement apparatus includes an image acquisition unit configured to acquire a first captured image obtained by capturing a measurement target object onto which a measurement pattern is projected, and a second captured image obtained by capturing the measurement target object irradiated with approximately uniform illumination, a smoothing filter determination unit configured to, based on the second captured image, determine a smoothing filter to be applied to the first captured image, a smoothing filter application unit configured to apply the smoothing filter determined by the smoothing filter determination unit to the first captured image, and a measurement unit configured to measure a distance from the measurement target object based on the first captured image to which the smoothing filter is applied.