The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Oct. 20, 2015
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Michael N. Mercier, Nashua, NH (US);

Kevin C. Cole, Nashua, NH (US);

Joseph M. Schlupf, Newburyport, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01); G06T 5/20 (2006.01); G06T 5/50 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06T 5/50 (2013.01); H04N 5/232 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/20032 (2013.01); G06T 2207/20216 (2013.01);
Abstract

Methods and systems for correcting non-uniformity in focal plane arrays include averaging pixel intensity values from a plurality of data captures to generate an image, spatially median filtering the image to generate a median filtered image, temporally stacking the median filtered image with at least one previously median filtered images to generate a median filtered image stack, and temporally median filtering a pixel offset value stack corresponding to each of a plurality of filtered pixel locations within the median filtered image stack to generate a process dataset.


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