The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Sep. 20, 2017
Applicant:
Trutag Technologies, Inc., Kapolei, HI (US);
Inventors:
Timothy Learmonth, Berkeley, CA (US);
Ting Zhou, Orinda, CA (US);
Assignee:
TruTag Technologies, Inc., Kapolei, HI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 5/00 (2006.01); G06K 7/14 (2006.01); G06K 19/06 (2006.01);
U.S. Cl.
CPC ...
G06K 5/00 (2013.01); G06K 7/14 (2013.01); G06K 7/1408 (2013.01); G06K 7/1417 (2013.01); G06K 19/06 (2013.01); G06K 19/06037 (2013.01); G06K 19/06075 (2013.01); G06K 19/06159 (2013.01);
Abstract
An identifier made using a silicon film fragment. The silicon film has a varying optical index of refraction. The varying optical index of refraction reflects one or more spectral peaks when illuminated with light. The one or more spectral peaks includes a reference peak. The silicon film is fragmented to generate the silicon film fragment.