The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Sep. 28, 2015
International Business Machines Corporation, Armonk, NY (US);
Hai Ji, Beijing, CN;
Yuan Yuan Li, Beijing, CN;
Xiao Yang Yang, Beijing, CN;
Chun Guang Zheng, Beijing, CN;
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method, system, and computer program product for detecting consistency between first and second data replicas is provided. Detecting consistency between data replicas includes acquiring first characteristic information of a first data replica and second characteristic information of a second data replica, the first and second characteristic information being associated with keys of the respective first and second data replicas. Detecting consistency between data replicas further include determining, based on a predetermined threshold value of a number of determination times, whether the first characteristic information is identical to the second characteristic information of the second data replica. In response to the determining that the first characteristic information and the second characteristic information are identical, whether the first data replica is consistent with the second data replica may then be confirmed.