The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Sep. 01, 2015
Applicant:

Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;

Inventors:

Takao Marukame, Tokyo, JP;

Yoshifumi Nishi, Kanagawa, JP;

Yusuke Higashi, Kanagawa, JP;

Jiezhi Chen, Kanagawa, JP;

Kazuya Matsuzawa, Kanagawa, JP;

Yuichiro Mitani, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 13/00 (2006.01); G06F 11/08 (2006.01); H03M 13/11 (2006.01); H03M 13/37 (2006.01); H03M 13/29 (2006.01); H03M 13/35 (2006.01); H03M 13/00 (2006.01); H03M 13/15 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1076 (2013.01); H03M 13/2906 (2013.01); H03M 13/353 (2013.01); H03M 13/6516 (2013.01); H03M 13/1102 (2013.01); H03M 13/152 (2013.01);
Abstract

According to an embodiment, a memory system includes a memory and a computation unit. Into the memory, data are written. The memory stores therein multiple check matrices. Each of the check matrices is associated with the number of errors in the written data. The computation unit is configured to perform a first error correction on the written data by selectively using, from among the check matrices, a check matrix associated with the number of errors recognized in the written data.


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