The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
May. 21, 2014
Endress + Hauser Conducta Gesellschaft Für Mess- Und Regeltechnik Mbh + Co. KG, Gerlingen, DE;
Michael Hanko, Dresden, DE;
Angela Eubisch, Chemnitz, DE;
Endress+Hauser Conducta Gmbh+Co. KG, Gerlingen, DE;
Abstract
An apparatus for automated determining of at least two different process parameters of a process liquid of a process, especially a bioprocess, comprising: a first measuring cell, which is embodied to provide a first measurement signal dependent on a first process parameter of a first sample of the process liquid; a second measuring cell, which is embodied to provide a second measurement signal dependent on a second process parameter of a second sample of the process liquid; and a control and evaluation system, which serves for monitoring and/or controlling the process, and which is embodied to receive and to process the first and second measurement signals, especially based on the first measurement signal to determine a measured value of the first process parameter and based on the second measurement signal to determine a measured value of the second process parameter; wherein the first measurement signal and the second measurement signal serve different functions in the context of the monitoring and/or controlling of the process. The first process parameter can be a control parameter (critical process parameter, CPP), and the second process parameter can be a product quality parameter (critical quality attribute, CQA) of the process.