The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Dec. 15, 2015
Palo Alto Research Center Incorporated, Palo Alto, CA (US);
Hoda M. A. Eldardiry, San Carlos, CA (US);
Linxia Liao, Fremont, CA (US);
Tomonori Honda, Redwood City, CA (US);
Bhaskar Saha, Redwood City, CA (US);
Rui Abreu, Sunnyvale, CA (US);
PALO ALTO RESEARCH CENTER INCORPORATED, Palo Alto, CA (US);
Abstract
A method and system for detecting fault in a machine. During operation, the system obtains control signals and corresponding sensor data that indicates a condition of the machine. The system determines consistent time intervals for each of the control signals. During a consistent time interval the standard deviation of a respective control signal is less than a respective predetermined threshold. The system aggregates the consistent time intervals to determine aggregate consistent intervals. The system then maps the aggregate consistent intervals to the sensor data to determine time interval segments for the sensor data. The system may generate features based on the sensor data. Each respective feature is generated from a time interval segment of the sensor data. The system trains a classifier using the features, and applies the classifier to additional sensor data indicating a condition of the machine over a period of time to detect a machine fault.