The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Aug. 27, 2015
Nuctech Company Limited, Beijing, CN;
Huaping Tang, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Zhuoyan Liu, Beijing, CN;
Yonggang Wang, Beijing, CN;
Zhanfeng Qin, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
An X-ray product quality online inspection device of the present invention comprises: a distributed X-ray source having a plurality of targets and being able to generate X-rays for irradiating an inspected product from the plurality of targets in a predetermined sequence; a detector for receiving the X-rays generated by the distributed X-ray source and outputting a signal representing characteristics of the received X-rays; a transport device which is located between the distributed X-ray source and the detector for carrying the inspected product to pass through an X-ray radiation region, wherein the transport device is arranged as a continuous transport mechanism which matches a production line of the inspected product; and a power supply and control device, which is used to supply power to and control the X-ray product quality online inspection device.