The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Nov. 06, 2015
Applicant:

Seiko Instruments Inc., Chiba-shi, Chiba, JP;

Inventor:

Takao Nakashimo, Chiba, JP;

Assignee:

ABLIC INC., Chiba, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 5/04 (2006.01); G01K 7/01 (2006.01);
U.S. Cl.
CPC ...
G01K 7/01 (2013.01); H02H 5/044 (2013.01);
Abstract

Provided is a temperature detection circuit having less manufacturing fluctuations in detection temperature and capable of easily adjusting the manufacturing fluctuations in detection temperature. The temperature detection circuit includes: a constant current circuit configured to output a constant current; a voltage-controlled current circuit, which is controlled by a voltage output from a heat sensitive element and is configured to output a current corresponding to temperature; and a current comparator configured to compare the constant current and the current corresponding to temperature, and output a detection signal indicating that a predetermined temperature is detected. Temperature characteristics of the constant current circuit and temperature characteristics of the voltage-controlled current circuit have a correlation with each other. The temperature detection circuit is configured to detect temperature based on a result of comparing the output current of the constant current circuit and the output current of the voltage-controlled current circuit.


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