The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Apr. 17, 2014
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Heiner Daerr, Hamburg, DE;

Klaus Juergen Engel, Veldhoven, NL;

Christoph Herrmann, Aachen, DE;

Roger Steadman Booker, Aachen, DE;

Ewald Roessl, Henstedt-Ulzburg, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/44 (2006.01); G01T 1/17 (2006.01); G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
G01J 1/44 (2013.01); G01T 1/171 (2013.01); G01T 1/24 (2013.01); G01T 1/247 (2013.01);
Abstract

The invention relates to a method and a pulse processing circuit () for the processing of current pulses (CP) generated by incident photons (X) in a piece of converter material, for instance in a pixel () of a radiation detector. Deviations of the pulse shape from a reference are detected and used to identify pulse corruption due to pile-up effects at high count rates and/or charge sharing between neighboring pixels. The deviation detection may for instance be achieved by generating, with a pulse shaper (), bipolar shaped pulses from the current pulse (CP) and/or two shaped pulses of different shapes which can be compared to each other.


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