The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Mar. 13, 2014
Applicant:

Abbott Diabetes Care Inc., Alameda, CA (US);

Inventors:

Junli Ou, Pleasanton, CA (US);

Erwin Satrya Budiman, Fremont, CA (US);

Assignee:

ABBOTT DIABETES CARE INC., Alameda, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/145 (2006.01); A61B 5/1459 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7271 (2013.01); A61B 5/14532 (2013.01); A61B 5/742 (2013.01); A61B 5/1459 (2013.01); A61B 2560/0228 (2013.01);
Abstract

Analyte sensor faults are detected. Datasets of glucose values sensor electronics are coupled to a glucose sensor in fluid contact with interstitial fluid under a skin surface. Baseline median glucose value and glucose variability values are computed, based on the first dataset. A baseline data point is stored. Evaluation median glucose value and variability are computed, based on the second dataset of glucose values. An evaluation data point is stored. A magnitude of a vector that extends between the baseline data point and the evaluation data point is computed. A component of the magnitude of the vector that is parallel to a hypoglycemia risk contour line is computed and compared to a predefined threshold value. An indication that a sensor fault has been detected if the component is greater than a threshold is displayed.


Find Patent Forward Citations

Ou, Junli. (2018). Sensor fault detection using analyte sensor data pattern comparison (U.S. Patent No. 10076285). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10076285

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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