The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2018
Filed:
Aug. 21, 2014
Applicants:
Wan Y. Shih, Bryn Mawr, PA (US);
Wei-heng Shih, Bryn Mawr, PA (US);
Hakki Yegingil, Philadelphia, PA (US);
Ari D. Brooks, Cherry Hill, NJ (US);
Inventors:
Wan Y. Shih, Bryn Mawr, PA (US);
Wei-Heng Shih, Bryn Mawr, PA (US);
Hakki Yegingil, Philadelphia, PA (US);
Ari D. Brooks, Cherry Hill, NJ (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/103 (2006.01); A61B 5/00 (2006.01); G01N 29/06 (2006.01); A61B 8/08 (2006.01); A61B 8/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0053 (2013.01); A61B 5/4244 (2013.01); A61B 5/4312 (2013.01); A61B 5/4381 (2013.01); A61B 5/441 (2013.01); A61B 8/085 (2013.01); A61B 8/403 (2013.01); A61B 8/485 (2013.01); G01N 29/0672 (2013.01); A61B 5/442 (2013.01); G01N 2291/02475 (2013.01); G01N 2291/02827 (2013.01);
Abstract
A sensor system for measuring an elastic modulus and a shear modulus and a method for evaluating a tissue. The invention pertains to a method for determining the presence of and/or characterizing abnormal growths, using a piezoelectric finger sensor (PEFS) system. The PEFS system may be particularly useful for screening for tumors and various forms of cancer. Additionally, the PEFS system may be useful for various dermatological applications.