The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2018

Filed:

Apr. 29, 2016
Applicant:

Nidek Co., Ltd., Gamagori, Aichi, JP;

Inventors:

Keiji Murata, Gamagori, JP;

Masaaki Hanebuchi, Nukata, JP;

Masakazu Endo, Okazaki, JP;

Assignee:

NIDEK CO., LTD., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01); A61B 3/117 (2006.01); A61B 3/12 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
A61B 3/102 (2013.01); A61B 3/0025 (2013.01); A61B 3/1025 (2013.01); A61B 3/117 (2013.01); A61B 3/1225 (2013.01);
Abstract

An ophthalmic imaging device for capturing a tomographic image of an eye, includes: an OCT optical system detecting interference of reference light and measurement light; a measurement optical system including an optical scanner and an objective optical system, the optical scanner being configured to deflect the measurement light to perform scanning with the measurement light; a driver configured to displace a relative position of the optical scanner with respect to the objective optical system in an optical axis direction; and a controller configured to control the driver to adjust a turning position of the measurement light in the optical axis direction. The controller changes the turning position between a first position corresponding to a first depth band of the eye and a second position corresponding to a second depth band of the eye which is different from the first depth band.


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