The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Jul. 04, 2014
Applicant:
Beam Engineering for Advanced Measurements Co., Orlando, FL (US);
Inventors:
Nelson Tabirian, Winter Park, FL (US);
James Hunt, Orlando, FL (US);
Assignee:
Beam Engineering for Advanced Measurements Co., Orlando, FL (US);
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
H04N 5/2256 (2013.01); H04N 7/183 (2013.01);
Abstract
Method for jamming or affecting the quality of photo and video recording, the method comprising illuminating the area, collecting light reflected or scattered from optical components such as camera lenses, amplifying them, and reversing the amplified beams back to the camera with phase conjugating mirror. The method may further comprise image acquisition and processing for identifying unwanted optical components and sensors, and electronically pointing and focusing a laser beam on said components and sensors.