The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Jul. 27, 2012
Applicants:

Cheuk Wan William Lau, Bellevue, WA (US);

Ravikant Cherukuri, Redmond, WA (US);

George Joy, Kirkland, WA (US);

Smriti Yamini, Redmond, WA (US);

Inventors:

Cheuk Wan William Lau, Bellevue, WA (US);

Ravikant Cherukuri, Redmond, WA (US);

George Joy, Kirkland, WA (US);

Smriti Yamini, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 29/08 (2006.01); H04L 12/26 (2006.01); G06F 11/34 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 67/1095 (2013.01); G06F 11/3409 (2013.01); H04L 43/065 (2013.01); H04L 67/125 (2013.01); H04L 67/22 (2013.01); H04L 69/28 (2013.01); G06F 11/3476 (2013.01); G06F 2201/835 (2013.01); G06F 2201/865 (2013.01);
Abstract

In one embodiment, a metric collection system may collect application metrics across multiple data centers in specific time intervals. A local collection pointmay establish an absolute reference time for a local data center. The local collection pointmay determine a source reporting interval for an applicationbased on the absolute reference time. The local collection pointmay receive a source metric reportfor the applicationbased on the source reporting interval.


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