The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2018
Filed:
Sep. 28, 2016
Applicant:
Omron Corporation, Kyoto-shi, Kyoto, JP;
Inventors:
Yoshihisa Minato, Kyoto, JP;
Kosuke Hattori, Kusatsu, JP;
Yutaka Kiuchi, Kusatsu, JP;
Yuki Akatsuka, Kyoto, JP;
Assignee:
OMRON Corporation, Kyoto-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H01L 21/67 (2006.01); G06T 7/00 (2017.01); H01L 21/68 (2006.01);
U.S. Cl.
CPC ...
H01L 21/67259 (2013.01); G06T 7/0004 (2013.01); G06T 7/0042 (2013.01); H01L 21/681 (2013.01); H01L 21/682 (2013.01); G06T 2207/10004 (2013.01); G06T 2207/30148 (2013.01);
Abstract
A hypothesis testing position detection apparatus improves robustness against abnormal detection values, and achieves both high accuracy estimation and high-speed estimation processing. An image processing apparatus extracts, from calculated values for a central position of a plane shape, one of the calculated values nearer a provisional center as a candidate for evaluation (testing) performed using a plurality of detection points.