The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2018

Filed:

Sep. 01, 2015
Applicant:

Toshiba Medical Systems Corporation, Otawara-Shi, JP;

Inventors:

Shuhei Nitta, Ota, JP;

Taichiro Shiodera, Shinagawa, JP;

Tomoyuki Takeguchi, Kawasaki, JP;

Hidenori Takeshima, Ebina, JP;

Toshiyuki Ono, Kawasaki, JP;

Takashi Ida, Kawasaki, JP;

Hiroaki Nakai, Otawara, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 (2006.01); G06T 11/00 (2006.01); G01N 23/046 (2018.01); A61B 6/00 (2006.01); G01N 23/087 (2018.01);
U.S. Cl.
CPC ...
G06T 11/005 (2013.01); A61B 6/032 (2013.01); A61B 6/4241 (2013.01); A61B 6/5205 (2013.01); A61B 6/481 (2013.01); A61B 6/482 (2013.01); G01N 23/046 (2013.01); G01N 23/087 (2013.01); G06T 2211/408 (2013.01);
Abstract

An X-ray computed-tomography (CT) apparatus of an embodiment includes an X-ray tube, an X-ray detector, and processing circuitry. The X-ray tube is configured to generate an X-ray. The X-ray detector includes a plurality of X-ray detection elements configured to output a signal based on the X-ray entered therein. The processing circuitry is configured to derive a constraint condition by using at least one piece of projection data out of a plurality of pieces of projection data corresponding energy bins of which differ at least partially, calculate an effective length that is a total length for which the X-ray has passed through a region in which a material to be decomposed is present, and generate image data showing information about the material by using the projection data and the effective length.


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